SPIE Proceedings [SPIE Eigth International Conference on Quality Control by Artificial Vision - Le Creusot, France (Wednesday 23 May 2007)] Eighth International Conference on Quality Control by Artificial Vision - Flaw detection on decorated glasses by color image processing
Busin, L., Fofi, David, Meriaudeau, Fabrice, Vandenbroucke, N., Macaire, L., Postaire, J.-G., Tahon, P.Volume:
6356
Year:
2007
Language:
english
DOI:
10.1117/12.736737
File:
PDF, 2.09 MB
english, 2007