SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Three-Dimensional Image Capture and Applications 2008 - A flexible 3D vision system based on structured light for in-line product inspection
Skotheim, Øystein, Corner, Brian D., Mochimaru, Masaaki, Nygaard, Jens Olav, Thielemann, Jens, Sitnik, Robert, Vollset, ThorVolume:
6805
Year:
2008
Language:
english
DOI:
10.1117/12.766230
File:
PDF, 376 KB
english, 2008