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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration - The quantitative assessment of small structure imaging ability by terahertz wave
Yang, Kun, Zhang, Xuping, Bock, Wojtek J., Zhao, Guozhong, Liang, Chengsen, Bao, Xiaoyi, Shum, Ping, Zhang, CunlinVolume:
7158
Year:
2008
Language:
english
DOI:
10.1117/12.806685
File:
PDF, 313 KB
english, 2008