SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments - Instrumentation design and precision analysis of the external diameter measurement system based on CCD parallel light projection method
Song, Qing, Sheng, Yunlong, Wang, Yongtian, Wu, Di, Liu, Jing, Zeng, Lijiang, Zhang, Chunsong, Huang, JiayongVolume:
7156
Year:
2008
Language:
english
DOI:
10.1117/12.807067
File:
PDF, 270 KB
english, 2008