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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Advanced Sensor Technologies and Applications - A new method based on morphologic filter and ant colony algorithm to enhance centroid detection accuracy of Shack-Hartmann wavefront sensor
Wang, Anbo, Zhang, Yanyan, Li, Mei, Liao, YanBiao, Song, AiGuo, Rao, Changhui, Ishii, Yukihiro, Fan, XudongVolume:
7157
Year:
2008
Language:
english
DOI:
10.1117/12.811873
File:
PDF, 466 KB
english, 2008