SPIE Proceedings [SPIE Ninth International Symposium on Laser Metrology - Unknown, Singapore (Monday 30 June 2008)] Ninth International Symposium on Laser Metrology - A simple method to estimate surface reflectance parameters for three light photometric stereo
Younes, Mohammad A., Quan, Chenggen, Asundi, Anand, Al-Nady, M. A.Volume:
7155
Year:
2008
Language:
english
DOI:
10.1117/12.814542
File:
PDF, 413 KB
english, 2008