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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, CA (Sunday 2 August 2009)] Instrumentation, Metrology, and Standards for Nanomanufacturing III - Nonstandard refraction of light from one-dimensional dielectric quasi-periodic surfaces
Gu, Zu-Han, Postek, Michael T., Allgair, John A., Wang, AntingVolume:
7405
Year:
2009
Language:
english
DOI:
10.1117/12.824626
File:
PDF, 3.15 MB
english, 2009