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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Accuracy assessment of novel two-axes rotating and single-axis translating calibration equipment
Liu, Bo, Ye, Shenghua, Zhang, Guangjun, Ye, Dong, Che, Rensheng, Ni, JunVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.838056
File:
PDF, 4.87 MB
english, 2009