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SPIE Proceedings [SPIE BiOS - San Francisco, California (Saturday 23 January 2010)] Design and Performance Validation of Phantoms Used in Conjunction with Optical Measurement of Tissue II - Characterizing deep optical-sectioning microscopy performance with scattering phantoms and numerical simulations
Liu, Jonathan T. C., Nordstrom, Robert J., Mandella, Michael J., Kino, Gordon S., Contag, Christopher H.Volume:
7567
Year:
2010
Language:
english
DOI:
10.1117/12.844315
File:
PDF, 1.66 MB
english, 2010