SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Fabrication 3D buried channel optical waveguide modulators on field-driven ion exchange process
Zhou, Zigang, Zhang, Yudong, Sasián, José, Chen, Wenqiang, Zhu, Li, Xiang, Libin, To, Sandy, Li, Jing, Luo, XiaoyingVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.863592
File:
PDF, 818 KB
english, 2010