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SPIE Proceedings [SPIE Security + Defence - Toulouse, France (Monday 20 September 2010)] Electro-Optical Remote Sensing, Photonic Technologies, and Applications IV - The manufacturing and testing of Cs 2 Te UV image intensifier
Fu, Rongguo, Kamerman, Gary W., Steinvall, Ove, Chang, Benkang, Qian, Yuansheng, Lewis, Keith L., Hollins, Richard C., Qiu, Yafeng, Merlet, Thomas J., Bishop, Gary J., Gonglewski, John D.Volume:
7835
Year:
2010
Language:
english
DOI:
10.1117/12.865514
File:
PDF, 980 KB
english, 2010