SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis of absolute testing based on even-odd functions by Zernike polynomials
Jia, Xin, Zhang, Yudong, Sasián, José, Xing, Tingwen, Lin, Wumei, Xiang, Libin, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.865546
File:
PDF, 826 KB
english, 2010