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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Polarization point-diffraction interferometer for high-precision testing of spherical surface
Wang, Daodang, Zhang, Yudong, Sasián, José, Yang, Yongying, Chen, Chen, Xiang, Libin, Zhuo, Yongmo, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.866682
File:
PDF, 413 KB
english, 2010