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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Study of multi-laser imaging scanning optical system based on integrated optical waveguide
Xu, Bi-jun, Yang, Li, Namba, Yoshiharu, Walker, David D., Li, ShengyiVolume:
7655
Year:
2010
Language:
english
DOI:
10.1117/12.866820
File:
PDF, 5.22 MB
english, 2010