SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Image hiding using optical interference
Zhang, Yan, Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Wang, WeiningVolume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.870342
File:
PDF, 1.23 MB
english, 2010