SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Study of LCE nanocomposites through electron microscopy
Torras, N., Postek, Michael T., Newbury, Dale E., Jobet, J., Marshall, J. E., Platek, S. Frank, Joy, David C., Zinoviev, K., Yates, D., Maugel, Tim K., Rotkina, L., Esteve, J., Terentjev, E. M., CampoVolume:
8036
Year:
2011
Language:
english
DOI:
10.1117/12.885539
File:
PDF, 5.50 MB
english, 2011