SPIE Proceedings [SPIE Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China (Sunday 8 August 2010)] Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Optoelectronic system on the base of the anamorphic element for the measuring of the elevation angles
Konyakhin, Igor, Merson, Alexey, Timofeev, Alexandr, Konyakhin, AlexeyVolume:
7544
Year:
2010
Language:
english
DOI:
10.1117/12.885594
File:
PDF, 501 KB
english, 2010