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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Visual alignment of mechanical structures using a Bessel beam datum: practical implementation
Gale, David M., Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.889300
File:
PDF, 2.80 MB
english, 2011