SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Modeling Aspects in Optical Metrology III - Deconvolution of non-zero solid angles effect in Bidirectional Scattering Distribution Function measurements

Ferrero, A., Bodermann, Bernd, Campos, J., Rabal, A. M., Pons, A., Hernanz, M. L., Corrons, A.
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Volume:
8083
Year:
2011
Language:
english
DOI:
10.1117/12.889528
File:
PDF, 235 KB
english, 2011
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