SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies - SCREEN photometric property detection system based on area CCD
Yan, Fu-cai, Wang, Yuelin, Xie, Huikai, Ye, Wei, Xu, Yu, Jin, Yufeng, Wang, Chao, Zhang, Yu-weiVolume:
8191
Year:
2011
Language:
english
DOI:
10.1117/12.900750
File:
PDF, 1.20 MB
english, 2011