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SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Amsterdam, Netherlands (Sunday 1 July 2012)] Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray - A thermal stress test of the depth-graded Pt/C reflectors used in the ASTRO-H Hard X-ray Telescope (HXT)
Maeda, Yoshitomo, Ichihara, Kou, Shionome, Yu, Sato, Takuro, Hayashi, Takayuki, Ishida, Manabu, Kan, Hiroaki, Namba, Yoshiharu, Takahashi, Hideaki, Miyazawa, Takuya, Ishibashi, Kazunori, Sakai, MichitVolume:
8443
Year:
2012
Language:
english
DOI:
10.1117/12.925847
File:
PDF, 1.14 MB
english, 2012