SPIE Proceedings [SPIE 30th Annual Technical Symposium -...

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SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Ray Calibration: Techniques, Sources, and Detectors - Los Alamos X-Ray Characterization Facilities For Plasma Diagnostics

Day, Robert H., Blake, Richard L., Stradling, Gary L., Trela, Walter J., Bartlett, Roger J., Lee, Ping, Rockett, Paul D.
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Volume:
689
Year:
1986
Language:
english
DOI:
10.1117/12.936583
File:
PDF, 8.82 MB
english, 1986
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