![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Cambridge Symposium_Intelligent Robotics Systems - Cambridge, MA (Tuesday 28 October 1986)] Automated Inspection and Measurement - Data Conversion Method And Processor For Binary Patterns
Silven, Olli, Virtanen, Ilkka, Chen, Michael J. W., Thibadeau, Robert H.Volume:
730
Year:
1987
Language:
english
DOI:
10.1117/12.937851
File:
PDF, 211 KB
english, 1987