SPIE Proceedings [SPIE Cambridge Symposium_Intelligent Robotics Systems - Cambridge, MA (Tuesday 28 October 1986)] Automated Inspection and Measurement - Developments In Image Processing For Industrial Inspection
Batchelor, B. G., Bowman, C. C., Chow, K. W., Goodman, S. J., Kelly, D. E., McCollum, A. J., Rowland, S. M., Chen, Michael J. W., Thibadeau, Robert H.Volume:
730
Year:
1987
Language:
english
DOI:
10.1117/12.937855
File:
PDF, 656 KB
english, 1987