SPIE Proceedings [SPIE 1986 Quebec Symposium - Quebec City, Canada (Tuesday 3 June 1986)] Optical Testing and Metrology - Alignment And Evaluation Of Integrated Optic Components Using An OTDR
Gauthier, Robert C., Paton, Barry E., Grover, Chander P.Volume:
661
Year:
1986
Language:
english
DOI:
10.1117/12.938618
File:
PDF, 169 KB
english, 1986