SPIE Proceedings [SPIE 1988 Los Angeles Symposium--O-E/LASE '88 - Los Angeles, CA (Monday 11 January 1988)] Scanning Microscopy Technologies and Applications - High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry
Abraham, David W., Martin, Yves, Wiekramasinghe, Kumar, Teague, E. ClaytonVolume:
897
Year:
1988
Language:
english
DOI:
10.1117/12.944546
File:
PDF, 3.95 MB
english, 1988