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SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Optical Testing and Metrology II - An Interpretation Of Moire Tnterferometry From Wavefront Interference Theory
Dai, Fu-long, McKelvie, James, Post, Daniel, Grover, Chander P.Volume:
954
Year:
1989
Language:
english
DOI:
10.1117/12.947581
File:
PDF, 788 KB
english, 1989