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SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Optical Testing and Metrology II - Ontical Sensing Principles And Optic Sensor Buses
Paton, Barry E., Grover, Chander P.Volume:
954
Year:
1989
Language:
english
DOI:
10.1117/12.947640
File:
PDF, 546 KB
english, 1989