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SPIE Proceedings [SPIE 1985 Microlithography Conferences - Santa Clara (Monday 11 March 1985)] Advances in Resist Technology and Processing II - Dissolution Rates Of Thin Polymer Films Using Laser Interferometry
Rodriguez, Ferdinand, Groele, Robert J., Krasicky, Philip D., Thompson, Larry F.Volume:
539
Year:
1985
Language:
english
DOI:
10.1117/12.947809
File:
PDF, 2.29 MB
english, 1985