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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Advances in Fabrication and Metrology for Optics and Large Optics - Fringe Analysis For Testing Optical Surfaces
Wong, Steve, Arnold, Jones B., Parks, Robert E.Volume:
966
Year:
1989
Language:
english
DOI:
10.1117/12.948078
File:
PDF, 672 KB
english, 1989