SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Properties and Characteristics of Optical Glass - Infrared Reflectance Measurement Of Ion Implanted Silica
Magruder III, R H., Morgan, S. H., Weeks, R A., Zuhr, R., Marker III, Alexander J.Volume:
970
Year:
1989
Language:
english
DOI:
10.1117/12.948172
File:
PDF, 437 KB
english, 1989