SPIE Proceedings [SPIE 1985 International Technical...

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SPIE Proceedings [SPIE 1985 International Technical Symposium/Europe - Cannes, France (Monday 25 November 1985)] Optics in Engineering Measurement - Application Of Grating Methods For Testing Of Material And Quality Control Including Digital Image Processing

Andresen, Klaus, Ritter, Reinhold, Schuetze, Rainer, Fagan, William F.
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Volume:
599
Year:
1986
Language:
english
DOI:
10.1117/12.952384
File:
PDF, 463 KB
english, 1986
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