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SPIE Proceedings [SPIE 1985 International Technical Symposium/Europe - Cannes, France (Monday 25 November 1985)] Optics in Engineering Measurement - The Application Of Phase Detection Technique Used In The Ultra-Precision Surface Flatness Measurement
Dong, Tai-Huo, Pao, Cheng-Kang, Dan, Lin, Fagan, William F.Volume:
599
Year:
1986
Language:
english
DOI:
10.1117/12.952393
File:
PDF, 461 KB
english, 1986