SPIE Proceedings [SPIE Image Assessment & Specification...

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SPIE Proceedings [SPIE Image Assessment & Specification - Rochester (Tuesday 1 January 1974)] Image Assessment and Specification - Problems Of OTF - Standardization For Non-Perfect Imaging Devices

van Leunen, Ir.J. A. J. .., PHILIPS, N. V., Dutton, David T.
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Volume:
46
Year:
1974
Language:
english
DOI:
10.1117/12.953986
File:
PDF, 175 KB
english, 1974
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