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SPIE Proceedings [SPIE Image Assessment & Specification - Rochester (Tuesday 1 January 1974)] Image Assessment and Specification - Testing Image Quality In Electro-Optical Devices
Weiser, Sidney, Dutton, David T.Volume:
46
Year:
1974
Language:
english
DOI:
10.1117/12.954011
File:
PDF, 7.09 MB
english, 1974