SPIE Proceedings [SPIE O-E/LASE'86 Symp (January 1986, Los...

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SPIE Proceedings [SPIE O-E/LASE'86 Symp (January 1986, Los Angeles) - Los Angeles, CA (Tuesday 21 January 1986)] Amorphous Semiconductors for Microelectronics - Amorphous Si:H Contact Linear Image Sensor

Kaneko, Setsuo, Okumura, Fujio, Sakamoto, Mikio, Uchida, Hiroyuki, Kajiwara, Yuji, Adler, David
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Volume:
617
Year:
1986
Language:
english
DOI:
10.1117/12.961082
File:
PDF, 6.22 MB
english, 1986
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