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SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - Absolute Reflectivity Measurements Of Multilayer Mirrors In The Soft X-Ray Region
Youn, K. B., Sella, C., Barchewitz, R., Arbaoui, M., Alehyane, N., Koch, E., Schmahl, Guenther A.Volume:
733
Year:
1986
Language:
english
DOI:
10.1117/12.964927
File:
PDF, 437 KB
english, 1986