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SPIE Proceedings [SPIE 14th Congress of the International Commission for Optics - Québec, Canada (Monday 24 August 1987)] Optics and the Information Age - Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness
Sthel, M. S., Lunazzi, J. J., Hogert, E. N., Gaggioli, N. G., Arsenault, Henri H.Volume:
813
Year:
1987
Language:
english
DOI:
10.1117/12.967396
File:
PDF, 72 KB
english, 1987