Fracture-Related Diagenesis May Impact Conductivity

Fracture-Related Diagenesis May Impact Conductivity

Weaver, Jim Dean, Parker, Mark, van Batenburg, Diederik W., Nguyen, Philip Duke
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Volume:
12
Language:
english
Journal:
SPE Journal
DOI:
10.2118/98236-pa
Date:
September, 2007
File:
PDF, 2.61 MB
english, 2007
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