Fracture-Related Diagenesis May Impact Conductivity
Weaver, Jim Dean, Parker, Mark, van Batenburg, Diederik W., Nguyen, Philip DukeVolume:
12
Language:
english
Journal:
SPE Journal
DOI:
10.2118/98236-pa
Date:
September, 2007
File:
PDF, 2.61 MB
english, 2007