In situ CTE measurements and damage detection using optical metrology
Rajaram, Satish, Cuadra, Jefferson, Saralaya, Raghav, Bartoli, Ivan, Kontsos, AntoniosVolume:
27
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/27/2/025202
Date:
February, 2016
File:
PDF, 1.30 MB
english, 2016