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[IEEE 2016 Annual IEEE Systems Conference (SysCon) - Orlando, FL, USA (2016.4.18-2016.4.21)] 2016 Annual IEEE Systems Conference (SysCon) - On the validation of path loss models based on field measurements using 800 MHz LTE network
Alqudah, Yazan A, Sababha, Belal, Elnashar, Ayman, Sababha, Sohaib H.Year:
2016
Language:
english
DOI:
10.1109/syscon.2016.7490590
File:
PDF, 564 KB
english, 2016