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SPIE Proceedings [SPIE International Conference on Microelectronics - Warsaw, Poland (Monday 21 September 1992)] International Conference of Microelectronics: Microelectronics '92 - Study of charge carriers mobility degradation in the MOS-transistor channel by means of Hall current
Dostanko, Anatoly P., Ivkin, Victor M., Salnikova, I. P., Sowinski, Andrzej, Grzybowski, Jan, Kucharski, Witold T., Romaniuk, Ryszard S.Volume:
1783
Year:
1992
Language:
english
DOI:
10.1117/12.130994
File:
PDF, 899 KB
english, 1992