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SPIE Proceedings [SPIE International Conference on Microelectronics - Warsaw, Poland (Monday 21 September 1992)] International Conference of Microelectronics: Microelectronics '92 - 600°C thermal oxidation of amorphous LPCVD silicon for thin film transistor application

Sarrabayrouse, G., Taurines, P., Scheid, E., Bielle-Daspet, D., de Mauduit, B., Guillemet, J. P., Martinez, A., Sowinski, Andrzej, Grzybowski, Jan, Kucharski, Witold T., Romaniuk, Ryszard S.
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Volume:
1783
Year:
1992
Language:
english
DOI:
10.1117/12.131058
File:
PDF, 457 KB
english, 1992
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