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SPIE Proceedings [SPIE Fibers '92 - Boston, MA (Tuesday 8 September 1992)] Integrated Optical Circuits II - Single-event test methodology for integrated optoelectronics
LaBel, Kenneth A., Cooley, James A., Stassinopoulos, E. G., Marshall, Paul W., Crabtree, Christina M., Wong, Ka-KhaVolume:
1794
Year:
1993
Language:
english
DOI:
10.1117/12.141888
File:
PDF, 321 KB
english, 1993