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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Advanced Optical Manufacturing and Testing IV - Aspheric surface testing by a phase-shifting shearing interferometer
Gao, Hong, Xin, Qiming, Huang, Kaixiang, Parks, Robert E., Doherty, Victor J.Volume:
1994
Year:
1994
Language:
english
DOI:
10.1117/12.167963
File:
PDF, 294 KB
english, 1994