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SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Imaging and Illumination for Metrology and Inspection - High-speed remote laser scanning using coherent fiber optics
Svetkoff, Donald J., Kilgus, Donald B., Berrich, David P., Svetkoff, Donald J.Volume:
2348
Year:
1994
Language:
english
DOI:
10.1117/12.198854
File:
PDF, 248 KB
english, 1994