SPIE Proceedings [SPIE Photonics East '95 - Philadelphia,...

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SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology - Three-dimensional line-scan imaging system for robotic measurement

Petty, Richard S., Godber, Simon X., Evans, J. Paul O., Robinson, McDonald, Descour, Michael R., Harding, Kevin G., Svetkoff, Donald J.
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Volume:
2599
Year:
1996
Language:
english
DOI:
10.1117/12.230372
File:
PDF, 399 KB
english, 1996
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