SPIE Proceedings [SPIE SPIE's 1996 International Symposium...

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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Gamma-Ray and Cosmic-Ray Detectors, Techniques, and Missions - Impacts of the shield thickness on the induced background

Diallo, Nene, Collin, Michel, Bersillon, Olivier, Cordier, Bertrand, Morel, Pascal, Flament, Jean L., Ramsey, Brian D., Parnell, Thomas A.
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Volume:
2806
Year:
1996
Language:
english
DOI:
10.1117/12.254005
File:
PDF, 245 KB
english, 1996
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