SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII - X-ray polarimetry and position measurements using the photoeffect and diffusion in a CCD
Schmidt, Klaus H., Buschhorn, Gerd W., Kotthaus, Rainer, Rzepka, Matthias, Weinmann, Peter M., Siegmund, Oswald H. W., Gummin, Mark A.Volume:
2808
Year:
1996
Language:
english
DOI:
10.1117/12.255997
File:
PDF, 469 KB
english, 1996