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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Imaging Spectrometry II - Evaluation of BRDF modeling for statistical classification of remotely sensed images
Valdez, Patrick F., Donohoe, Gregory W., Motomatsu, Sheila E., Descour, Michael R., Mooney, Jonathan M.Volume:
2819
Year:
1996
Language:
english
DOI:
10.1117/12.258058
File:
PDF, 300 KB
english, 1996